Ultra-High Resolution &
Ultra-High Sensitivity Thin Film Measurement System
for Hard Disks
The n&k 1500-D utilizes raw Reflectance (R) data to determine the optical properties (n and k) and thicknesses of thin films, in particular diamond-like carbon (DLC) and magnetic layers, comprising hard disks. This manual load system with automated stage is designed to handle all sizes of hard disks. With a 1mm spot size, the raw reflectance data is acquired over a wide wavelength range (190 – 1000nm) with optimized signal-to-noise ratio, resulting in the capability of the n&k 1500-D to accurately measure thickness and determine Hydrogen and Nitrogen content of increasingly thinner DLC, independent of any variations in the mag layers.
On the software end, a valid physical model utilizes the Forouhi-Bloomer Dispersion Equation for n and k, to analyze raw Reflectance data. The Forouhi-Bloomer (FB) model describes the Refractive Index, n, and the Extinction Coefficient, k, as functions of wavelength, λ, and was derived based on first principles quantum mechanics. The scientific derivations of the FB model were originally published in 1986 and 1988, and a related patent was subsequently granted in 1990.
n and k spectra of the top three layers of the film structure
Mean Thickness: 62.8 Å
Standard Dev.: 3.04 Å
Mean Thickness: 52.4 Å
Standard Dev.: 1.66 Å
Mean Thickness: 50.0 Å
Standard Dev.: 1.15 Å
Note: Based on Customer’s input, Ru and SUL thicknesses were kept fixed at 195Å & 1000Å
Cloud storage, desktop PC’s, and laptops continue to grow demand for data storage peripherals. Our products are viable metrology solutions for both Head processing and Disk Media processing.
1-408-513-3800
1-866-873-6241 (Toll Free)
1-408-513-3850 (Fax)
Inquiries: inforequest@nandk.com
Sales: sales@nandk.com
Customer Support: service@nandk.com
n&k Technology Inc.
80 Las Colinas Lane
San Jose, CA 95119
