Displays continue to play a part of everyday life by way of smartphones, tablets, TV’s and monitors. Our products continue to enable the display manufacturers to produce high quality displays at the highest yield possible.
The n&k Gemini series are automated metrology systems used to fully characterize and monitor Thin Film and OCD applications for both current and next generation IC processes. Capable of simultaneous Reflectance and Transmittance measurements the Gemini series is ideal for applications with transparent substrates (i.e., Photomasks, SiC Wafers, Quartz Wafers, Flat Panels, etc.)
If you are looking for a Manual Load Metrology system, we would be very interested in listening to your requests to determine if we can manufacture the right metrology system for you.