Optical metrology for Conventional, Phase Shift, EUV, and Mask Blanks photomasks remains key for Photomask shops worldwide. Our unique combination offering to measure both Reflectance and Transmittance has proven to be very beneficial to Photomask makers throughout the years.
Key Applications
The n&k Gemini series are automated metrology systems used to fully characterize and monitor Thin Film and OCD applications for both current and next generation IC processes. Capable of simultaneous Reflectance and Transmittance measurements the Gemini series is ideal for applications with transparent substrates (i.e., Photomasks, SiC Wafers, Quartz Wafers, Flat Panels, etc.)
1-408-513-3800
1-866-873-6241 (Toll Free)
1-408-513-3850 (Fax)
Inquiries: inforequest@nandk.com
Sales: sales@nandk.com
Customer Support: service@nandk.com
n&k Technology Inc.
80 Las Colinas Lane
San Jose, CA 95119