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FAQS:

Is it possible to non-destructively measure a very thick Poly-Si film whose thickness is greater than 20µm and is also very rough? read more»

How can you determine if a film such as porous oxide and porous SiOC is inhomogeneous, that is whether a film’s n and k spectra vary within the film layer itself? read more»

What makes n&k different?

n&k’s unique combination of hardware + software is a breakthrough in thin film metrology & scatterometry

  • Strongest signal-to-noise ratio of measured data over the widest wavelength range in the industry
  • Analysis of measured data based on valid physical models
learn more »

News & Events

    • • The n&k EclipSE: Combined Ellipsometry & Reflectometry for Ultra-Thin Films + OCD Measurements of Complex Trenches & Holes...
    • • Latest Generation Metrology for Combined Thin Films and OCD Measurements....
    • • TSV Development Project....
    • more info »

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