N&K,Reflectometry,Film Thickness,Ellipsometry,Optical Critical Dimension
  • Facebook
  • Google
  • Twitter
  • Rss
Call Now: 1-866-873-6241
Menu
  • Home
  • About n&k
    • Company Profile
    • Our Executive Team
      • Dr. Rahim Forouhi
      • Dr. Iris Bloomer
    • The n&k Premise
    • Company History
    • Testimonials
    • News and Events
  • Metrology Systems
    • By Industry:
    • Semiconductor
      • OptiPrime-X
      • Olympian Series
      • OptiPrime-CD Series
      • LittleFoot-CD Series
      • TF Series
    • Photomask
      • Gemini Series
      • Gemini TF Series
    • Data Storage
      • Disk Metrology
    • Flat Panel Display
      • Gemini-TF Series
    • Solar
      • Gemini-TF Series
    • By Application:
    • Scatterometry (OCD & Thin Film)
      • OptiPrime-X
      • Olympian Series
      • OptiPrime-CD Series
      • LittleFoot-CD Series
      • Gemini Series
    • Thin Film Only
      • TF Series
      • Gemini-TF
      • Disk Metrology
    • Transparent or Opaque Substrates
      • Gemini Series
      • Gemini-TF Series
    • Opaque Substrates Only
      • OptiPrime-X
      • TF Series
      • Olympian Series
      • OptiPrime-CD Series
      • LittleFoot-CD Series
      • Disk Metrology
      • Manual Load Solutions
    • FAQs
    • n&k Brochures
  • System Capabilities
  • Publications & Papers
    • Original
    • Semiconductor
    • Photomask
    • Flat Panel
    • Data Storage
    • Research & Development
    • FB Dispersion Equation Validation
    • White Papers
  • Contact Us
    • Corporate Headquarters
    • Sales & Support
    • Careers
  • n&k-slide1_image
  • n&k-slide2_image
  • n&k-slide3_image
  • n&k-slide4_image
  • n&k-slide5_image

FAQS:

Is it possible to non-destructively measure a very thick Poly-Si film whose thickness is greater than 20µm and is also very rough? read more»

How can you determine if a film such as porous oxide and porous SiOC is inhomogeneous, that is whether a film’s n and k spectra vary within the film layer itself? read more»

What makes n&k different?

n&k’s unique combination of hardware + software is a breakthrough in thin film metrology & scatterometry

  • Strongest signal-to-noise ratio of measured data over the widest wavelength range in the industry
  • Analysis of measured data based on valid physical models
learn more »

News & Events

    • • The n&k EclipSE: Combined Ellipsometry & Reflectometry for Ultra-Thin Films + OCD Measurements of Complex Trenches & Holes...
    • • Latest Generation Metrology for Combined Thin Films and OCD Measurements....
    • • TSV Development Project....
    • more info »

Sales & Support

n&k has 15 Sales & Support Offices Worldwide to serve you.

Contact us now to learn more:

Sales: sales@nandk.com


Service: service@nandk.com
About n&k Metrology Systems System Capabilties Publications & Papers

Contact us:

1-408-513-3800

Sales:

sales@nandk.com

1-408-513-3800

Support:

service@nandk.com

1-408-513-3800

best earbuds for 50

Terms of UsePrivacy Policy© 2020 n&k Technology, Inc.