Cloud storage, desktop PC’s, and laptops continue to grow demand for data storage peripherals. Our products are viable metrology solutions for Disk Media, Heads, and Slider processing.
Key Applications
DLC Thickness and optical properties
%H and %N within DLC layer
Thickness of Mag layers and optical properties
Contact us further for information on Heads and Slider processing capabilities.
The n&k 1500-D measures unpolarized reflectance (R) to determine the optical properties (n and k) from 190nm – 1000nm, and thicknesses of thin films, in particular diamond-like carbon (DLC) and magnetic layers, comprising hard disks.
