Internal Combustion Engine (ICE) and Electric Vehicle (EV) automotive platforms both require the most reliable and cost-effective semiconductor solutions. Today’s vehicles use Silicon (Si) MEMS sensors and actuators, integrated circuits (IC) for motor control and for sensor-fusion toward autonomous driving, as well as silicon carbide (SiC) and gallium-nitride (GaN) power chips.
To meet international standards, fabrication processes must be monitored to ensure meeting the highest quality and reliability. In-line process control using non-contact optical metrology ensures yield today and performance tomorrow.
The n&k Technology advantage of hardware, software, and applications expertise results in unparalleled cost-effective metrology for High Volume Manufacturing (HVM) fabs worldwide.
Metrology for Essential Process Steps
