Facebook
Google
Twitter
Rss
Call Now: 1-866-873-6241
Menu
Home
About n&k
Company Profile
Our Executive Team
Dr. Rahim Forouhi
Dr. Iris Bloomer
The n&k Premise
Company History
Testimonials
News and Events
Metrology Systems
By Industry:
Semiconductor
OptiPrime-X
Olympian Series
OptiPrime-CD Series
LittleFoot-CD Series
TF Series
Photomask
Gemini Series
Gemini TF Series
Data Storage
Disk Metrology
Flat Panel Display
Gemini-TF Series
Solar
Gemini-TF Series
By Application:
Scatterometry (OCD & Thin Film)
OptiPrime-X
Olympian Series
OptiPrime-CD Series
LittleFoot-CD Series
Gemini Series
Thin Film Only
TF Series
Gemini-TF
Disk Metrology
Transparent or Opaque Substrates
Gemini Series
Gemini-TF Series
Opaque Substrates Only
OptiPrime-X
TF Series
Olympian Series
OptiPrime-CD Series
LittleFoot-CD Series
Disk Metrology
Manual Load Solutions
FAQs
n&k Brochures
System Capabilities
Publications & Papers
Original
Semiconductor
Photomask
Flat Panel
Data Storage
Research & Development
FB Dispersion Equation Validation
White Papers
Contact Us
Corporate Headquarters
Sales & Support
Careers
Publications & Papers
Publications
Papers
Original
Semiconductor
Photomask
Flat Panel
Data Storage
Research & Development
FB Dispersion Equation Validation
White Papers
Papers
White Papers
-Coming Soon